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Optika B-510METR Metallurgical Incident and Transmitted Trinocular Microscope IOS W-PLAN MET 50x-500x EU Specs
| Brand | Optika |
| Full Model Code / SKU | B-510METR |
| Country of Origin | Italy |
| Microscope Type | Professional Industrial Metallurgical Trinocular Microscope featuring Both Incident and Transmitted Light Systems |
| Optical System Type | IOS Infinity Corrected Optical System providing distortion-free tracking profiles across wide structural fields |
| Observation Tube Type | Trinocular observation assembly combining dual visual ocular ports with an overhead vertical photo-imaging line |
| Tube Inclination & Rotation | Ocular viewing barrels are inclined at a comfortable 30-degree angle with adjustable interpupillary spacing distances |
| Eyepiece / Field of Number | Pair of extra-widefield high-eyepoint WF10x eyepieces displaying an oversized field index of exactly 22 mm |
| Nosepiece Design | Quintuple revolving nosepiece operating on internal precision ball-bearings with structural click-stop positioning |
| Objectives Classification | IOS W-PLAN MET Professional LWD Infinitely Corrected Metallurgical Plan-Achromatic Optical Lenses |
| Objectives Magnification Breakdown | Includes four specialized lenses: IOS W-PLAN MET 5x, 10x, 20x, and a high-resolution 50x objective cartridge |
| Total Magnification Range | Provides discrete compound surface magnification tracking checkpoints at 50x, 100x, 200x, and up to 500x points |
| Focusing Type & Graduation | Coaxial coarse and fine adjustment tracker wheels fitted with safety stop brackets; fine tracking increments at 0.002 mm |
| Stage Dimensions & Surface Coating | Oversized double-layer mechanical sliding specimen stage measuring 233 x 147 mm with a wear-resistant black finish coat |
| Stage Travel Range & Controls | Coaxial drop-down X-Y directional adjustment tracks delivering an active cross-travel span of exactly 78 x 54 mm |
| Condenser Type & Numerical Aperture | Abbe condenser unit integrated below the stage tracking 1.25 N.A. with iris diaphragm for the transmitted light track |
| Illumination Transmitted Type | Patented X-LED8 system featuring a high-power 8W white LED module paired with a custom field iris layout for full Koehler setup |
| Illumination Epi-EPI/Reflected | High-intensity 5W white LED Epi-illumination attachment containing integrated field and aperture diaphragm blocks |
| Light Intensity Management | Bilateral independent electronic dimming controls managing separate incident and transmitted light paths |
| Camera Port / C-Mount Adapter Split | Dedicated vertical photo port tower featuring a selectable light path splitter configuration (100% visual / 100% video) |
| Contrast Methods Capability | Reflected brightfield metallography, transmitted brightfield analysis, material structural defect mapping checks |
| Power Supply & Voltage Input | Standard integrated European specification multi-voltage internal power transformer accepting 100-240V AC inputs |
| Physical Dimensions & Net Weight | Chassis height 440 mm, width 270 mm, depth 430 mm, industrial structural metal housing mass exactly 10.5 kg |
| Standard Package Accessories Included | Trinocular metallurgical frame, four MET objectives, incident illumination block, blue and green filter slots, power cord |
| Primary Application & Environment | Opaque material auditing benches, composite material science cells, electronics multi-layer substrate tracking desks |
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