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Kern & Sohn OKM 172 Binocular Metallurgical Polarization Microscope Infinity Plan Achromatic 50x-400x Incident Halogen 30W Specs
| Brand | Kern & Sohn |
| Full Model Code / SKU | OKM 172 (Industrial Quality Control Series) |
| Country of Origin | Germany |
| Microscope Type | Upright Binocular Metallurgical and Polarization Material Inspection Microscope System |
| Optical System Type | Infinity Corrected Optical System (IOS) Lens Layout Path |
| Observation Tube Type | Binocular Head Unit configured with precision reflective optical routing prisms |
| Tube Inclination & Rotation | 30° inclined viewing track, 360° rotatable head, adjustable individual interpupillary tracking levers; diopter balance setup on left eyepiece stem |
| Eyepiece / Field of Number | WF 10x / 18 mm (Paired set, wide-field configuration calibrated for structural metrology alignment logs) |
| Nosepiece Design | Revolving quadruple (4-position) forward-facing objective turret housing operating on precision ball bearings |
| Objectives Classification | Infinity Plan Achromatic Corrected Material Inspection Long Working Distance (LWD) Objective Lens Line |
| Objectives Magnification Breakdown | Infinity Plan LWD metallurgical series tracking: 5x/0.13, 10x/0.25, 20x/0.40, and 40x/0.60 structural micro pathways |
| Total Magnification Range | 50x, 100x, 200x, and 400x technical engineering structural limits |
| Focusing Type & Graduation | Coaxial coarse and fine adjustment block knobs operating on a singular concentric axis framework; fine tracking graduation 2 micrometers |
| Stage Dimensions & Surface Coating | Oversized double-layer mechanical stage platform measuring approx. 200 x 140 mm with hard-wearing industrial protective coating layer |
| Stage Travel Range & Controls | X-Y axis translation layout measuring 76 x 50 mm tracking smooth sample movement via low-positioned coaxial control handles |
| Condenser Type & Numerical Aperture | None (Incident illumination layout; surface structure tracking configuration) |
| Illumination Transmitted Type | None |
| Illumination Epi-EPI/Reflected | Epi-Illumination block system tracking 6V/30W Halogen source equipped with integrated field diaphragm and aperture diaphragm mechanisms |
| Light Intensity Management | Electronic continuous variable analog rheostat rotary control wheel on base panel for tracking target brightness |
| Camera Port / C-Mount Adapter Split | None (Binocular configuration; requires digital eyepiece adapter for image capture logs) |
| Contrast Methods Capability | Opaque material brightfield inspection tracking, basic incident polarization screening, surface finish defect mapping |
| Power Supply & Voltage Input | Standard line connection powered via 100-240V AC power module line links |
| Physical Dimensions & Net Weight | Base layout 250 x 200 mm, overall structural height 420 mm, complete assembly net weight approx. 8.0 kg |
| Standard Package Accessories Included | OKM 172 binocular industrial stand, four metallurgical Infinity Plan objectives, pair of WF 10x/18mm eyepieces, slide-in polarizer and analyzer block tracking tools, power adapter, dust cover, manual |
| Primary Application & Environment | Metal processing workshops, manufacturing quality control stations, electronic components assembly checking, mineralogical sample testing hubs |
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