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Motic BA310 MET Binocular Microscope Specs
| Brand | Motic |
| Full Model Code / SKU | BA310 MET Binocular (Reflected Light Industrial Inspection Workstation) |
| Country of Origin | Germany / China |
| Microscope Type | Binocular Metallurgical Microscope configured for opaque materials testing, silicon wafer evaluation, and quality control processing |
| Optical System Type | CCIS Color Corrected Infinity Optical System optimized for reflected light incident ray geometries |
| Observation Tube Type | Binocular Head Unit, Siedentopf type incorporating internal optical path alignment blocks |
| Tube Inclination & Rotation | 30° inclined viewing posture for physical comfort, 360° rotating head section, 55-75 mm interpupillary distance tracking adjustability |
| Eyepiece / Field of Number | N-WF 10x / 20 mm (High-eyepoint wide field ocular modules with independent diopter adjustment rings on both tubes) |
| Nosepiece Design | Reversed quintuple revolving nosepiece block tracking automated mechanical positional click-stop alignments |
| Objectives Classification | CCIS LM Plan Achromatic Infinity Optical Lens Series tailored specifically for long working distance metallurgical setups |
| Objectives Magnification Breakdown | LM Plan Achromatic 5x, LM Plan Achromatic 10x, LM Plan Achromatic 20x, LM Plan Achromatic 50x (Long working distance dry configuration) |
| Total Magnification Range | 50x, 100x, 200x, 500x high-contrast surface evaluation parameters |
| Focusing Type & Graduation | Coaxial coarse and fine adjustment tracking assemblies operating with precise internal brass tension-tuning controls; fine graduation at 0.002 mm |
| Stage Dimensions & Surface Coating | Oversized industrial mechanical stage measuring exactly 180 x 140 mm treated with hard-coat scratch-resistant surface plating and integrated metal slide inserts |
| Stage Travel Range & Controls | Right-hand low-position coaxial translation controls mapping precisely 75 mm on the X-axis and 50 mm on the Y-axis lines |
| Condenser Type & Numerical Aperture | Integrated EPI reflected illuminator condenser layout containing adjustable field diaphragm and aperture diaphragm alignment modules |
| Illumination Transmitted Type | None (Solid baseline block for purely opaque engineering specimens) |
| Illumination Epi-EPI/Reflected | EPI Reflected Light Attachment featuring a 12V / 50W Quartz Halogen lamp house module providing high-intensity incident illumination |
| Light Intensity Management | Continuous variable electronic analog rotary potentiometer layout integrated with local brightness tracking logs |
| Camera Port / C-Mount Adapter Split | None (Dedicated dual eye binocular optical pathway tracking paths) |
| Contrast Methods Capability | Incident reflected brightfield analysis, simple polarization validation tests, metallographic surface grain mapping logs |
| Power Supply & Voltage Input | External power pack box or internal transformer module accepting universal mains 100-240V AC electrical currents |
| Physical Dimensions & Net Weight | Chassis depth 400 mm, profile width 220 mm, complete assembly height 450 mm, structure net weight approx. 10.5 kg |
| Standard Package Accessories Included | BA310 MET binocular frame, EPI illumination attachment with 50W Halogen house, CCIS LM Plan objectives (5x, 10x, 20x, 50x), two N-WF 10x/20mm eyepieces, power cable lines, blue filter disc, vinyl dust cover |
| Primary Application & Environment | Industrial metallurgical quality verification labs, foundry cross-section analysis cells, electronics hardware manufacturing inspection desks, opaque compound material research bays |
Additional information
| brands | Motic |
|---|
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